Work

Development of an algorithm for tip-related artifacts identification in AFM biological film imaging

Year: 2005

Type: article

Abstract: One major drawback identified in atomic force microscopy imaging is the dependence of the image's precision on the shape of the probe tip. In this paper a simple algorithm is proposed to provide artifact identification signaling in-situ tip features in atomic force microscopy images. The base of the identifications lied when the angle formed between two scanned points was kept the same as the tip sweeps a certain length of the sample. The potential of the described method was illustrated on a chitosan polysaccharide film. The images produced were compared to evaluate tip-artifact regions. This algorithm showed promise as a tool in the measurement and characterization fields to separate true images from artificial images in probe microscopy.

Source: Brazilian Archives of Biology and Technology

DOI: 10.1590/s1516-89132005000500020

Authors: Rubens Bernardes-Filho, Odilio Benedito Garrido de Assis

Institution: Embrapa Instrumentação

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: diamond

Funder: Conselho Nacional de Desenvolvimento Científico e Tecnológico

OpenAlex ID: W2106446077