Work

Clean and metal‐contaminated Si(110) surfaces studied by RHEED, XPS and STM

Year: 1988

Type: article

Source: Journal of Microscopy

DOI: 10.1111/j.1365-2818.1988.tb01412.x

Authors: E. J. van Loenen, D. Dijkkamp, A. J. Hoeven

Institution: Philips (Netherlands)

Language: English

Topic: Surface and Thin Film Phenomena

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2107763201

FWCI: 1.873

Cites: 23

Cited by: 101

Related to: 10