Work

I–V methods to extract junction parameters with special emphasis on low series resistance

Year: 1999

Type: article

Source: Solid-State Electronics

DOI: 10.1016/s0038-1101(98)00338-4

Authors: A Kaminski, J.J Marchand, A Laugier

Institutions: Centre National de la Recherche Scientifique, Institut National des Sciences Appliquées de Lyon

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2108736798

FWCI: 0.573

Cites: 25

Cited by: 81

Related to: 10