Work

SEE sensitivity of a COTS GaN transistor and silicon MOSFETs

Year: 2007

Type: conference-paper

Source: European Conference on Radiation and Its Effects on Components and Systems

DOI: 10.1109/radecs.2007.5205553

Authors: S. Bazzoli, S. Girard, V. Ferlet-Cavrois, J. Baggio, P. Paillet, O. Duhamel

Institution: Commissariat à l'Énergie Atomique et aux Énergies Alternatives

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2109028352

FWCI:

Cites: 18

Cited by: 48

Related to: 10