Work

Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction

Year: 2011

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2011.2122430

Authors: Melanie Po-Leen Ooi, Eric Kwang Joo Joo, Ye Chow Kuang, S. Demidenko, L. Kleeman, Chris Wei Keong Chan

Institutions: Monash University Malaysia, Monash University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Monash University

OpenAlex ID: W2109366175

FWCI: 6.409

Cites: 37

Cited by: 34

Related to: 10