Work

Coupled Ionic and Electronic Transport Model of Thin‐Film Semiconductor Memristive Behavior

Year: 2009

Type: article

Source: Small

DOI: 10.1002/smll.200801323

Authors: Dmitri B. Strukov, Julien L. Borghetti, R. Stanley Williams

Institution: Hewlett-Packard (United States)

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Intelligence Advanced Research Projects Activity

OpenAlex ID: W2109987134

FWCI: 23.51

Cites: 24

Cited by: 273

Related to: 10