Work

Reliability challenges in avionics due to silicon aging

Year: 2012

Type: conference-paper

Source: IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

DOI: 10.1109/ddecs.2012.6219085

Authors: Behzad Mesgarzadeh, Ingemar Soderquist Saab, Atila Alvandpour

Institution: Linköping University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2111513467

FWCI: 0.817

Cites: 42

Cited by: 6

Related to: 10