On the Characterization and Optimization of On-Chip Cache Reliability against Soft Errors
Year: 2009
Type: article
Source: IEEE Transactions on Computers
DOI: 10.1109/tc.2009.33
Authors: Shuai Wang, Jie Hu, S.G. Ziavras
Institution: New Jersey Institute of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2111664042