Work

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT

Year: 2010

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2010.07.141

Authors: G.A. Koné, B. Grandchamp, C. Hainaut, F. Marc, C. Maneux, N. Labat, T. Zimmer, V. Nodjiadjim, J. Godin

Institutions: Centre National de la Recherche Scientifique, Laboratoire de l'Intégration du Matériau au Système, Université Bordeaux-I, III V Lab

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Agence Nationale de la Recherche

OpenAlex ID: W2113214701

FWCI: 2.451

Cites: 12

Cited by: 14

Related to: 10