Work

Snapback and overprogramming modeling using finite-element electrothermal simulation

Year: 2008

Type: conference-paper

Source: Non-Volatile Memory Technology Symposium

DOI: 10.1109/nvmt.2008.4731192

Authors: F. Chen, J-T. Yeh, D-S. Chao, Y-C. Chen, M-J. Kao, M.-J. Tsai

Institution: Industrial Technology Research Institute

Language: English

Topic: Phase-change materials and chalcogenides

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2114385669

FWCI: 1.957

Cites: 9

Cited by: 2

Related to: 10