Work

Fast and simple method for estimation and separation of radiation-induced traps in MOSFETs devices

Year: 2011

Type: conference-paper

Source: IEEE International Conference on Quality and Reliability

DOI: 10.1109/icqr.2011.6031763

Authors: B. Nadji, H. Tahi, B. Djezzar

Institutions: University of Boumerdes, Centre de Développement des Technologies Avancées

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2114686995

FWCI: 0.847

Cites: 11

Cited by: 3

Related to: 10