Series resistance effects in thin oxide capacitor evaluation
Year: 1992
Type: article
Source: IEEE Electron Device Letters
DOI: 10.1109/55.192827
Authors: F. Pio, L. Ravazzi, C. Riva
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2115102756