Work

Integrating VISA, IVI and ATEasy to migrate legacy test systems

Year: 2005

Type: article

Source: IEEE Aerospace and Electronic Systems Magazine

DOI: 10.1109/maes.2005.1453810

Author: L. Gutterman

Language: English

Topic: Engineering and Test Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2116309486

FWCI: 1.796

Cites:

Cited by: 11

Related to: 10