Work

A Case Study of Problems in JEDEC HBM ESD Test Standard

Year: 2009

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2009.2027124

Authors: Mingxu Huo, Qing Guo, Yan Han, Lei Shen, Qi Liu, Bo Song, Qingrong Ma, Kehan Zhu, Yehui Shen, Xiaoyang Du, Shurong Dong

Institutions: University of California, Riverside, Zhejiang University, Fudan University

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2116455238

FWCI: 0.528

Cites: 10

Cited by: 11

Related to: 10