Work

A Highly Reliable Multi-level and 2-bit/cell Operation of Wrapped-Select-Gate (WSG) SONOS Memory with Optimized ONO Thickness

Year: 2007

Type: conference-paper

Source: International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)

DOI: 10.1109/vtsa.2007.378896

Authors: Woei-Cherng Wu, Tien-Sheng Chao, Wu-Chin Peng, Wen-Luh Yang, Jer-Chyi Wang, Jian-Hao Chen, Ming-Wen Ma, Chao-Sung Lai, Tsung-Yu Yang, Tzu-Ping Chen, Chien-Hung Chen, Chih-Hung Lin, Hwi-Huang Chen, Joe Ko

Institutions: National Yang Ming Chiao Tung University, Feng Chia University, Chang Gung University, United Microelectronics (Taiwan)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2117652575

FWCI:

Cites: 6

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Related to: 10