Low-Power and Highly Reliable Multilevel Operation in $ \hbox{ZrO}_{2}$ 1T1R RRAM
Year: 2011
Type: article
Source: IEEE Electron Device Letters
Institutions: National Yang Ming Chiao Tung University, Winbond (Taiwan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2117809083