A rigorous dispersive characterization of microstrip cross and T junctions
Year: 1990
Type: article
DOI: 10.1109/22.64564
Authors: S.-C. Wu, H.-Y. Yang, N.G. Alexopoulos, I. Wolff
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2118988470
