Work

Overview of Power Loss Measurement Techniques in Power Electronics Systems

Year: 2007

Type: article

Source: IEEE Transactions on Industry Applications

DOI: 10.1109/tia.2007.895730

Authors: Chucheng Xiao, Gang Chen, Willem G. H. Odendaal

Institution: Virginia Tech

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2119285331

FWCI: 6.54

Cites: 36

Cited by: 226

Related to: 10