Work

Broad-band electromagnetic radiation damage in GaAs MESFETs

Year: 2003

Type: conference-paper

Source: IEEE Microwave and Millimeter-Wave Monolithic Circuits Symposium (MMWMC)

DOI: 10.1109/mcs.1992.186036

Authors: J.H. McAdoo, W.M. Bollen, W. Catoe, R. Kaul

Institution: Harry Diamond Laboratories

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2119711027

FWCI:

Cites: 3

Cited by: 1

Related to: 10