Work

Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration

Year: 2008

Type: conference-paper

Source: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

DOI: 10.1109/apccas.2008.4745960

Authors: Wen-Yi Chen, Ming-Dou Ker, Yeh-Jen Huang, Yeh-Ning Jou, Geeng-Lih Lin

Institutions: National Yang Ming Chiao Tung University, Vanguard International Semiconductor (Taiwan)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2124187017

FWCI: 1.895

Cites: 10

Cited by: 15

Related to: 10