Work

Leakage Current Minimization in Deep-Submicron Conventional Single Cell SRAM

Year: 2010

Type: conference-paper

Source: International Conference on Recent Trends in Information, Telecommunication and Computing (ITC)

DOI: 10.1109/itc.2010.9

Authors: Neeraj Kr. Shukla, Debasis Mukherjee, Shilpi Birla, R.K. Singh

Institutions: The NorthCap University, Sir Padampat Singhania University, Kumaun University

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2124339365

FWCI: 0.427

Cites: 12

Cited by: 7

Related to: 10