Work

Use of noise thermometry to study the effects of self-heating in submicrometer SOI MOSFETs

Year: 1992

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/55.145053

Authors: R.J.T. Bunyan, M.J. Uren, J.C. Alderman, W. Eccleston

Institutions: University College Cork, University of Liverpool

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: University of Liverpool

OpenAlex ID: W2126103124

FWCI: 4.172

Cites: 11

Cited by: 44

Related to: 10