A measurement method for verifying impedance match condition of assembled RFID tag
Year: 2009
Type: conference-paper
Authors: Sung-Lin Chen, Ken-Huang Lin
Institution: National Sun Yat-sen University
Language: English
Topic: RFID technology advancements
Subfield: Computer Networks and Communications
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2128477293