ABCD modeling of crosstalk coupling noise to analyze the signal integrity losses on the victim interconnect in DSM chips
Year: 2005
Type: conference-paper
DOI: 10.1109/icvd.2005.40
Authors: A.K. Palit, V. Meyer, W. Anheier, J. Schloeffel
Institutions: University of Bremen, Philips (Germany)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2129259404