The impact of technology scaling on ESD robustness and protection circuit design
Year: 1995
Type: article
DOI: 10.1109/95.390309
Authors: A. Amerasekera, C. Duvvury
Institution: Texas Instruments (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Loughborough University
OpenAlex ID: W2132118564