Work

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

Year: 2003

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.1999.805883

Authors: P. Nigh, D. Vallett, A. Patel, J. Wright, F. Motika, D. Forlenza, R. Kurtulik, W. Chong

Institution: IBM (United States)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2132829258

FWCI: 9.511

Cites: 19

Cited by: 53

Related to: 10