Unsharp Masking Sharpening Detection via Overshoot Artifacts Analysis
Year: 2011
Type: article
Source: IEEE Signal Processing Letters
Authors: Gang Cao, Yao Zhao, Rongrong Ni, Alex C. Kot
Institutions: Beijing Jiaotong University, Nanyang Technological University
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2136313643