Work

Fabrication and Characterization of GaAs MOS Capacitor With CVD Grown Polymer-Based Thin Film as a Gate Dielectric

Year: 2010

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2010.2051488

Authors: El Hassane Oulachgar, Cetin Aktik, Mihai Scarlete

Institutions: Université de Sherbrooke, Bishop's University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2136936744

FWCI: 0.245

Cites: 18

Cited by: 5

Related to: 10