Work

Factors Influencing the Leakage Current in Embedded SiGe Source/Drain Junctions

Year: 2008

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2007.914843

Authors: Eddy Simoen, Mireia Bargallo Gonzalez, Bertrand Vissouvanadin, M. K. Chowdhury, Peter Verheyen, Andriy Hikavyy, H. Bender, Roger Loo, Cor Claeys, Vladimir Machkaoutsan, P. Tomasini, S. Thomas, J. P. Lu, J. W. Weijtmans, R. Wise

Institutions: IMEC, ASM International (Belgium), Texas Instruments (United States)

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139021734

FWCI: 2.395

Cites: 23

Cited by: 10

Related to: 10