Work

Characterization of Dislocations in HgCdTe Heteroepitaxial Layers Using a New Substrate Removal Technique

Year: 2009

Type: article

Source: Journal of Electronic Materials

DOI: 10.1007/s11664-009-0771-x

Authors: P. Lamarre, C. Fulk, D. D’Orsogna, E. Bellotti, F. Smith, P. LoVecchio, M. B. Reine, T. Parodos, J. Marciniec, S. P. Tobin, J. Markunas

Institutions: BAE Systems (United States), Boston University, United States Army Combat Capabilities Development Command, United States Army, Night Vision and Electronic Sensors Directorate

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139264194

FWCI: 0.793

Cites: 14

Cited by: 6

Related to: 10