Work

Impact of Silicon Nitride Gate Dielectric Composition on the Stability of Low Temperature Nanocrystalline Silicon Thin Film Transistors

Year: 2011

Type: conference-paper

Source: ECS Transactions

DOI: 10.1149/1.3572276

Authors: Mohammad Esmaeili-Rad, Gholamreza Chaji, Flora Li, Maryam Moradi, Andrei Sazonov, Arokia Nathan

Institutions: University of Waterloo, Wistron (Taiwan), IGNIS Innovation (Canada), University College London

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Royal Society, Natural Sciences and Engineering Research Council of Canada

OpenAlex ID: W2139283477

FWCI:

Cites: 1

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Related to: 9