Work

Proton-induced SEU in SiGe digital logic at cryogenic temperatures

Year: 2008

Type: article

Source: Solid-State Electronics

DOI: 10.1016/j.sse.2008.06.038

Authors: Akil. K. Sutton, Kurt Moen, John D. Cressler, Martin A. Carts, Paul W. Marshall, Jonathan A. Pellish, Vishwa Ramachandran, Robert A. Reed, Michael L. Alles, Guofu Niu

Institutions: Georgia Institute of Technology, Goddard Space Flight Center, Vanderbilt University, Auburn University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139288118

FWCI: 2.99

Cites: 40

Cited by: 19

Related to: 10