Accurate channel length extraction by split C-V measurements on short-channel MOSFETs
Year: 2006
Type: article
Source: IEEE Electron Device Letters
Authors: S. Severi, G. Curatola, C. Kerner, K. De Meyer
Institutions: IMEC, KU Leuven, Philips (Belgium)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2139454122