Work

A study of cause-effect structure acquisition for anomaly diagnosis in discrete manufacturing processes

Year: 2008

Type: conference-paper

Source: Conference proceedings/Conference proceedings - IEEE International Conference on Systems, Man, and Cybernetics

DOI: 10.1109/icsmc.2008.4811601

Authors: Maki Endo, Kosuke Tsuruta, Soichiro Kita, Hiroshi Nakajima

Institution: Omron (Japan)

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2139507816

FWCI: 2.832

Cites: 8

Cited by: 10

Related to: 10