Work

Improved technique for peak integration for crystallographic data collected with position-sensitive detectors: a dynamic mask procedure

Year: 1981

Type: article

Source: Acta Crystallographica Section A

DOI: 10.1107/s0567739481001332

Authors: L. Sjölin, A. Wlodawer

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139574512

FWCI: 3.92

Cites:

Cited by: 22

Related to: 10