An improved two-frequency method of capacitance measurement for SrTiO3 as high-k gate dielectric
Year: 2002
Type: article
Source: IEEE Electron Device Letters
Authors: Hang-Ting Lue, Chih-Yi Liu, Tseung-Yuen Tseng
Institution: National Yang Ming Chiao Tung University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2139685578