Work

Investigating aluminum thin films properties by stochastic analysis

Year: 2008

Type: article

Source: Surface and Interface Analysis

DOI: 10.1002/sia.2719

Authors: S. Hosseinabadi, A. Mortezaali, A. A. Masoudi

Institution: Alzahra University

Language: English

Topic: Surface Roughness and Optical Measurements

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139781282

FWCI: 1.048

Cites: 24

Cited by: 16

Related to: 10