Work

Test-structure free modeling method for de-embedding the effects of pads on device modeling

Year: 2004

Type: conference-paper

Source: IEEE Electronic Components and Technology Conference (ECTC)

DOI: 10.1109/ectc.2003.1216530

Authors: Cheolung Cha, Zhaoran Huang, N.M. Jokerst, M.A. Brooke

Institution: Georgia Institute of Technology

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2139797538

FWCI: 0.827

Cites: 15

Cited by: 6

Related to: 10