Impact of Unrealistic Worst Case Modeling on the Technologies Perf'orr/iance of Vlsi Circuits in Deep Sub-micron Cmos
Year: 2004
Type: article
Authors: A. Nardi, A. Neviani, E. Zanoni, Carlo Guardiani, B Agate
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2139885026
