Work

A Rapid Fault Injection Approach for Measuring SEU Sensitivity in Complex Processors

Year: 2007

Type: conference-paper

Source: IEEE International On-Line Testing Symposium (IOLTS)

DOI: 10.1109/iolts.2007.9

Authors: Marta Portela-Garcia, Celia Lopez-Ongil, Mario Garcia-Valderas, Luis Entrena

Institutions: Universidad Carlos III de Madrid, Universidad Politécnica de Madrid

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2144148609

FWCI: 2.51

Cites: 17

Cited by: 23

Related to: 10