Work

Application of synchrotron radiation to anomalous scattering for structure analysis with a four-circle diffractometer

Year: 1984

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s0021889884011419

Authors: T. Sakamaki, S. Hosoya, T. Tagai, K. Ohsumi, Y. Satow

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2145007151

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Cites:

Cited by: 7

Related to: 10