Graded gate VDMOSFET
Year: 2000
Type: article
Source: IEEE Electron Device Letters
DOI: 10.1109/55.830973
Authors: Shuming Xu, Kian Paau Can, Pang Dow Foo, Yi Su, Yong Liu
Institution: Institute of Microelectronics
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: National University of Singapore
OpenAlex ID: W2145227971