Work

Anomalous kink-related excess noise in MOSFETs at 4.2 K

Year: 1991

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/16.75222

Authors: B. Dierickx, E. Simoen, S. Cos, J. Vermeiren, C. Claeys, G.J. Declerck

Institution: IMEC

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2148439999

FWCI: 4.481

Cites: 13

Cited by: 22

Related to: 10