Work

Practical aspects of reliability analysis for IC designs

Year: 2006

Type: conference-abstract

Source: ACM/IEEE Design Automation Conference (DAC)

DOI: 10.1145/1146909.1146962

Authors: T. Pompl, C. Schlünder, M. Hommel, H. Nielen, J. Schneider

Institution: Infineon Technologies (Germany)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2149121027

Cites: 7

Cited by: 27

Related to: 10