Work

Faster statistical cell characterization using adjoint sensitivity analysis

Year: 2008

Type: conference-paper

Source: Custom Integrated Circuits Conference

DOI: 10.1109/cicc.2008.4672065

Authors: Ben Gu, Kiran Gullapalli, Yun Zhang, Savithri Sundareswaran

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2153138227

FWCI: 1.422

Cites: 14

Cited by: 8

Related to: 10