Work

Total dose testing of a CMOS charged particle spectrometer

Year: 1997

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/23.658968

Authors: B.R. Hancock, G.A. Soli

Institution: Jet Propulsion Laboratory

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Aeronautics and Space Administration

OpenAlex ID: W2153445087

FWCI: 0.962

Cites: 9

Cited by: 23

Related to: 10