ED/sup 4/I: error detection by diverse data and duplicated instructions
Year: 2002
Type: article
Source: IEEE Transactions on Computers
DOI: 10.1109/12.980007
Authors: N. Oh, S. Mitra, E.J. McCluskey
Institution: Stanford University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2153554709