Work

PXI: the future of test

Year: 2003

Type: conference-paper

Source: IEEE AUTOTESTCON (IEEE Systems Readiness Technology Conference)

DOI: 10.1109/autest.2002.1047892

Author: L. Gutterman

Language: English

Topic: Engineering and Test Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2157707302

FWCI: 0.43

Cites:

Cited by: 9

Related to: 10