Work

Microscopic analysis of defects in a high resistivity silicon detector irradiated to 1.7/spl times/10/sup 15/ n/cm/sup 2/

Year: 1996

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/23.507153

Authors: Z. Li, G. Ghislotti, H.W. Kraner, C.J. Li, B. Nielsen, H. Feick, G. Lindstroem

Institutions: Brookhaven National Laboratory, Chinese Academy of Sciences, Institute of Semiconductors, Universität Hamburg

Language: English

Topic: Particle Detector Development and Performance

Subfield: Nuclear and High Energy Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2158165010

FWCI: 3.119

Cites: 19

Cited by: 24

Related to: 10