Work

Drift reliability optimization in VLSI circuit design

Year: 1991

Type: conference-paper

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas.1991.176797

Authors: M.A. Styblinski, M. Huang

Institution: Texas A&M University

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2159309463

FWCI: 1.388

Cites: 9

Cited by: 3

Related to: 10